This high precision standard is designed for calibrating image analysis systems and identifying deviations and distortions in optical imaging equipment. The 75 x 25mm slide has a series of grid patterns of known edge length which can be used for precision measurement.
A mono size array of 15µm spots is used to check image distortion. A root-2 progression of spots from 3 to 48µm allows threshold levels and resolution to be checked. Using the log-normal distribution array of 100 spots, the mean and standard deviation of the spot sizes can be determined and compared with the certified values. It is supplied with recommendations for use and an individual NPL certificate of calibration.
There are four test areas (see image):
1. 400 x 400µm square grid sub-divided into 200, 100, 50 and 25µm squares which can be used to detect gross image distortions and as an accurate two dimensional stage micrometer.
2. 20 x 17 array of nominally 15µm diameter dots can be used to identify lens distortions.
3. Root-2 array of spots from 3 to 48µm in diameter for determining the threshold level of cameras and microscope systems.
4. Log-normal distribution array of 100 spots ranging from 4.5 to 27µm in diameter enables the mean and standard deviation of the spot size to be determined and compared with certified values.
Price is individual, so please contact us in order to receive more information.
