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Certified silicon test specimens

Certified silicon test specimens

2,953.32zł 966,666.57złPrice range: 2,953.32zł through 966,666.57zł

Individual silicon test specimens are calibrated to a guaranteed accuracy of better than 1% and are supplied with a laboratory certificate as documented proof. The equipment is checked against a reference specimen calibrated by the NPL by laser beam interferometry.
Also see our recalibration service.

The silicon specimen can be supplied on any stub.

Variant Code Net price Gross price Quantity Availability
Certified Planotec silicon test specimen, unmounted AGS1930-CT 2,953.32zł 3,632.58zł
Certified Planotec silicon test specimen on 12.5mm pin stub AGS1932-CT 3,006.48zł 3,697.97zł
Certified Planotec silicon test specimen on 10mm JEOL stub AGS1932A-CT 3,114.83zł 3,831.24zł
Certified Planotec silicon test specimen on 15mm Topcon/ISI/ABT stub AGS1932B-CT 3,114.83zł 3,831.24zł
Certified Planotec silicon test specimen on 15mm Hitachi stub AGS1932C-CT 3,114.83zł 3,831.24zł
Certified Planotec silicon test specimen on customer stub AGS1932D-CT 966,666.57zł 1,188,999.88zł
Certified Planotec silicon test specimen on 12.5mm JEOL stub AGS1932E-CT 3,114.83zł 3,831.24zł
Certified Planotec silicon test specimen for incident light microscopy mounted on black slide AGS1934-CT 3,191.47zł 3,925.51zł
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