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Shop / SEM CalibrationCoatingFIB SpecimenKitsPreparationSEM MicroscopeSpecimen stubs & mountsStorageVacuum / Calibration Calibration & test specimensFIB Calibration standards / Calibration & test specimens / Pelcotec CDMS 0.1T Critical Dimension Magnification Standard
Pelcotec CDMS 0.1T Critical Dimension Magnification Standard

Pelcotec CDMS 0.1T Critical Dimension Magnification Standard

3,177.59zł – 3,273.03złPrice range: 3,177.59zł through 3,273.03zł

The Pelcotec™ CDMS Calibration Standard is easy to use and very useful for quick and precise SEM, FESEM, FIB, CD-SEM, LM, and AFM magnification calibration.

Unique, economically priced, yet fully featured and traceable calibration standards for a wide measurement range. They are made using the latest semiconductor and MEMS manufacturing techniques. The Pelcotec™ CDMS Calibration Standard is available with two features size ranges, which are both offered as traceable and certified standards, making a total of 4 versions.

The CDMS -0.1T is fully traceable with features from 2.0mm to 100nm for a magnification range up to 10 – 200,000x; for all SEM and most FESEM applications.

Feature sizes for the Pelcotec™ CDMS-0.1T & 0.1C are: 2mm, 1mm, 0.5mm, 0.25mm, 10µm, 5µm, 2µm, 1µm, 500nm, 250nm and 100nm.

The Pelcotec™ CDMS Critical Dimensions and Magnification Standards are made on an ultra flat silicon substrate with a precise 50nm chromium deposition for the features up to 5µm and a combination of 50nm gold over 20nm chromium for the features sizes from 2µm to 100nm. The Cr and Au/Cr on Si provides excellent contrast both in SE and BSE imaging mode. The features are easier to determine than on etched Si standards. Since the silicon substrate, the chromium and the chromium/gold features are all conductive there are no charging issues with this calibration standard. Due to its sturdy construction the CDMS standard can be cleaned using a plasma cleaner.

The smaller features are nested for easy navigation and quick calibration. The accuracy of the features is 0.3% or better. The actual size of the standard is 2.5 x 2.5mm with a thickness of 675µm ±25µm. There is no coating on the Si surface. Each Pelcotec™ CDMS calibration standard has a unique identification number.

They are available either unmounted or mounted on a choice of SEM holders.

For AFM applications the Pelcotec™ CDMS is mounted on a 12mm AFM disc, for LM applications it is mounted on a 25 x 75mm glass slide.

Variant Code Net price Gross price Quantity Availability
Pelcotec CDMS-0.1T, 2mm - 100nm, traceable, unmounted AG683-01 3,177.59zł 3,908.44zł
Pelcotec CDMS-0.1T, 2mm - 100nm, traceable, Mount A AG683-01A 3,273.03zł 4,025.83zł
Pelcotec CDMS-0.1T, 2mm - 100nm, traceable, Mount B AG683-01B 3,273.03zł 4,025.83zł
Pelcotec CDMS-0.1T, 2mm - 100nm, traceable, Mount C AG683-01C 3,273.03zł 4,025.83zł
Pelcotec CDMS-0.1T, 2mm - 100nm, traceable, Mount D AG683-01D 3,273.03zł 4,025.83zł
Pelcotec CDMS-0.1T, 2mm - 100nm, traceable, Mount E AG683-01E 3,273.03zł 4,025.83zł
Pelcotec CDMS-0.1T, 2mm - 100nm, traceable, Mount F AG683-01F 3,273.03zł 4,025.83zł
Pelcotec CDMS-0.1T, 2mm - 100nm, traceable, Mount K AG683-01K 3,273.03zł 4,025.83zł
Pelcotec CDMS-0.1T, 2mm - 100nm, traceable, Mount L AG683-01L 3,273.03zł 4,025.83zł
Pelcotec CDMS-0.1T, 2mm - 100nm, traceable, Mount M AG683-01M 3,273.03zł 4,025.83zł
Pelcotec CDMS-0.1T, 2mm - 100nm, traceable, Mount O AG683-01O 3,273.03zł 4,025.83zł
Pelcotec CDMS-0.1T, 2mm - 100nm, traceable, Mount P AG683-01P 3,273.03zł 4,025.83zł
Pelcotec CDMS-0.1T, 2mm - 100nm, traceable, Mount Q AG683-01Q 3,273.03zł 4,025.83zł
Pelcotec CDMS-0.1T, 2mm - 100nm, traceable, Mount R AG683-01R 3,273.03zł 4,025.83zł
Pelcotec CDMS-0.1T, 2mm - 100nm, traceable, 12mm AFM Disc AG683-01AFM 3,273.03zł 4,025.83zł
Pelcotec CDMS-0.1T, 2mm - 100nm, traceable, 25 x 75mm glass slide 25x75mm AG683-01S 3,273.03zł 4,025.83zł
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×
  • SEM
    • Calibration
      • Calibration & test specimens
      • FIB Calibration standards
    • Coating
      • Coating materials
      • Sputter targets
      • Vacuum oils & greases
    • FIB Specimen
      • FIB Calibration standards
      • FIB needles
      • FIB specimen preparation
      • FiB specimen storage
      • Specimen stubs
    • Kits
      • Consumable kits
      • Replication kits
    • Preparation
      • Grinding & polishing
      • Materials embedding
    • SEM Microscope
      • Filaments
      • SEM apertures
      • X-ray beam finder
    • Specimen stubs & mounts
      • FIB specimen stubs
      • Grids – SEM Finder
      • Specimen stubs
      • Specimen stubs – modular
    • Storage
      • Containers and cabinets for samples
      • Packaging, labels
      • Storage boxes
      • tool boxes
    • Vacuum
      • Refrigerator liquids
      • Sputter targets
      • Vacum oils and greases
      • Vacuum coating materials
  • TEM
    • Coating
      • Coating materials
      • Sputter targets
      • Vacuum oils & greases
    • Embedding
      • Cold mounting resins
      • Diamond knives
      • Hot mounting resins
      • Materials embedding
    • Grids
      • Grid boxes & storage
      • Grids
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      • Grids: Athene
      • Molybdenum grids
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      • Support films: Holey Carbon
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      • TEM calibration standards
    • Other
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      • Tissue processing chemicals
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  • LM
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      • Eyepiece graticules
      • Feezing & heating stages
      • Immersion oils
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      • Mounting media
      • Slides
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      • Sectionning
      • Tissue processing consumables
  • AFM
    • Probes
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      • Electric mode probes
      • Probes without blade
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      • Diamond knives
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      • Substrates
  • METALLOGRAPHY
    • Cutting
      • Abrasive cutting discs
      • Coolants and accessories
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    • Grinding
      • Abrasive paper withou glue
      • CAMEO Platinium, Silver, Gold self-adhesive grinding discs
      • CAMEO Platinum, Silver, Gold grinding discs with magnetic coating
      • Grinding wheels
      • Self-adhesive abrasive papers
      • Systems for mounting papers and grinding-polishing discs
    • Including
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