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Shop / SEM CalibrationCoatingFIB SpecimenKitsPreparationSEM MicroscopeSpecimen stubs & mountsStorageVacuum / Calibration Calibration & test specimensFIB Calibration standards / Calibration & test specimens / Pelcotec CDMS 1T Critical Dimension Magnification Standard
Pelcotec CDMS 1T Critical Dimension Magnification Standard

Pelcotec CDMS 1T Critical Dimension Magnification Standard

114.07€ – 129.54€Price range: 114.07€ through 129.54€

The Pelcotec™ CDMS Calibration Standard is easy to use and very useful for quick and precise SEM, FESEM, FIB, CD-SEM, LM, and AFM magnification calibration.

Unique, economically priced, yet fully featured and traceable calibration standards for a wide measurement range. They are made using the latest semiconductor and MEMS manufacturing techniques. The Pelcotec™ CDMS Calibration Standard is available with two features size ranges, which are both offered as traceable and certified standards, making a total of 4 versions.

The CDMS-1T is fully traceable with features from 2.0mm to 1um for a magnification range from 10x – 20,000x and is ideal for desk top SEMs and low to medium magnification applications.

Feature sizes for the Pelcotec™ CDMS-1T and -1C are: 2mm, 1mm, 0.5mm, 0.25mm, 10µm, 5µm, 2µm and 1µm.

The Pelcotec™ CDMS Critical Dimensions and Magnification Standards are made on an ultra flat silicon substrate with a precise 50nm chromium deposition for the features up to 5µm and a combination of 50nm gold over 20nm chromium for the features sizes from 2µm to 100nm. The Cr and Au/Cr on Si provides excellent contrast both in SE and BSE imaging mode. The features are easier to determine than on etched Si standards. Since the silicon substrate, the chromium and the chromium/gold features are all conductive there are no charging issues with this calibration standard. Due to its sturdy construction the CDMS standard can be cleaned using a plasma cleaner.

The smaller features are nested for easy navigation and quick calibration. The accuracy of the features is 0.3% or better. The actual size of the standard is 2.5 x 2.5mm with a thickness of 675µm ±25µm. There is no coating on the Si surface. Each Pelcotec CDMS calibration standard has a unique identification number.

They are available either unmounted or mounted on a choice of SEM holders.

For AFM applications the Pelcotec™ CDMS is mounted on a 12mm AFM disc, for LM applications it is mounted on a 25 x 75mm glass slide.

Variant Code Net price Gross price Quantity Availability
Pelcotec CDMS-1T, 2mm - 1μm, traceable, unmounted AG682-1 114.07€ 140.31€
Pelcotec CDMS-1T, 2mm - 1μm, traceable, Mount A AG682-1A 129.54€ 159.34€
Pelcotec CDMS-1T, 2mm - 1μm, traceable, Mount B AG682-1B 129.54€ 159.34€
Pelcotec CDMS-1T, 2mm - 1μm, traceable, Mount C AG682-1C 129.54€ 159.34€
Pelcotec CDMS-1T, 2mm - 1μm, traceable, Mount D AG682-1D 129.54€ 159.34€
Pelcotec CDMS-1T, 2mm - 1μm, traceable, Mount E AG682-1E 129.54€ 159.34€
Pelcotec CDMS-1T, 2mm - 1μm, traceable, Mount F AG682-1F 129.54€ 159.34€
Pelcotec CDMS-1T, 2mm - 1μm, traceable, Mount K AG682-1K 129.54€ 159.34€
Pelcotec CDMS-1T, 2mm - 1μm, traceable, Mount L AG682-1L 129.54€ 159.34€
Pelcotec CDMS-1T, 2mm - 1μm, traceable, Mount M AG682-1M 129.54€ 159.34€
Pelcotec CDMS-1T, 2mm - 1μm, traceable, Mount O AG682-1O 129.54€ 159.34€
Pelcotec CDMS-1T, 2mm - 1μm, traceable, Mount P AG682-1P 129.54€ 159.34€
Pelcotec CDMS-1T, 2mm - 1μm, traceable, Mount Q AG682-1Q 129.54€ 159.34€
Pelcotec CDMS-1T, 2mm - 1μm, traceable, Mount R AG682-1R 129.54€ 159.34€
Pelcotec CDMS-1T, 2mm - 1μm, traceable, 12mm AFM Disc AG682-1AFM 129.54€ 159.34€
Pelcotec CDMS-1T, 2mm - 1μm, traceable, 25 x 75mm glass slide AG682-1S 129.54€ 159.34€
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×
  • SEM
    • Calibration
      • Calibration & test specimens
      • FIB Calibration standards
    • Coating
      • Coating materials
      • Sputter targets
      • Vacuum oils & greases
    • FIB Specimen
      • FIB Calibration standards
      • FIB needles
      • FIB specimen preparation
      • FiB specimen storage
      • Specimen stubs
    • Kits
      • Consumable kits
      • Replication kits
    • Preparation
      • Grinding & polishing
      • Materials embedding
    • SEM Microscope
      • Filaments
      • SEM apertures
      • X-ray beam finder
    • Specimen stubs & mounts
      • FIB specimen stubs
      • Grids – SEM Finder
      • Specimen stubs
      • Specimen stubs – modular
    • Storage
      • Containers and cabinets for samples
      • Packaging, labels
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    • Vacuum
      • Refrigerator liquids
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  • TEM
    • Coating
      • Coating materials
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      • Vacuum oils & greases
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      • Hot mounting resins
      • Materials embedding
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      • TEM calibration standards
    • Other
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  • LM
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    • Specimen observation
      • Filters
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      • Micrometers stages
    • Specimen preparation
      • Diamond knives – Histo
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      • Material processing consumables
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    • Probes
      • Anti-wear layer probes
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