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Niskoprofilowy stolik na próbki do SEM

SEM Specimen Stubs, 12.7mm dia, 36° chamfer, with 6mm pin, low profile

305.07zł

These low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications. The 38° complimentary angle pin stub is suitable for FEI DualBeam™ and FIB systems, while the 36° complimentary angle pin stub is for Zeiss/Leo CrossBeam® and NVision systems. The stubs are fully compatible with standard pin stub mounts (3.2mm diameter pin) for sample storage and transport. These stubs can also be used with adapters in Hitachi, JEOL and ISI systems.

Variant Code Net price Gross price Quantity Availability
36° pin stub, low profile (Pack of 10) AGG3029 305.07zł 375.24zł
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